NIKON CORPORATION
2-15-3, Konan,
Minato-ku
Tokyo 108-6290
(JP)
SUZUKI Hirohisa
c/o Shiga International Patent Office
Gran Tokyo South Tower,
1-9-2, Marunouchi,
Chiyoda-ku
Tokyo 100-6620
(JP)
Англ.Semiconductor manufacturing machines and systems; polishing machines and apparatus for wafer.
Англ.Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin-operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire-extinguishing apparatus; photographic equipment and parts and accessories therefor; cameras and parts and accessories therefor; digital cameras and parts and accessories therefor; camera lenses; batteries and battery chargers for cameras and digital cameras; remote controls for cameras and digital cameras; cases for cameras and digital cameras; straps for cameras and digital cameras; optical apparatus and instruments; binoculars; telescopes; range finders; computer software for editing and managing of photographs and movies; electronic publications; non-contact measuring machines and instruments; computer software; liquid crystal projector; cameras with liquid crystal projector; digital cameras with liquid crystal projector; microscopes; electron microscopes; biological microscopes; X-ray electron microscopes; rifle scope; telescopic sights; monocles; spectacles; eyeglasses; glasses; eyewear; ophthalmic lenses; optical lenses; lenses for spectacles; lenses for eyeglasses; lenses for glasses; lenses for eyewear; eyeglass frames; solid state memory card; flash memory card; cell culture and observation system; magnifying glasses; crossbow scope; digital photo frame; telescope for firearm; sighting telescopes for firearms; liquid crystal manufacturing machines and systems; semiconductor exposure apparatus; liquid crystal exposure apparatus; semiconductor testing apparatus; liquid crystal testing apparatus; parts and accessories for semiconductor manufacturing machines and systems; parts and accessories for liquid crystal manufacturing machines and systems; parts and accessories for semiconductor exposure apparatus; parts and accessories for liquid crystal exposure apparatus; parts and accessories for semiconductor testing apparatus; parts and accessories for liquid crystal testing apparatus; parts and accessories for polishing machines and apparatus for wafer.